Publications

Publications

International Journal

  • Choi, J., Ali, T., Kim, B.*, Lee, H.S, and Jeong, M. K. (In Press). A novel method for identifying competitors using a financial network. IEEE Transactions on Engineering Management.
  • Lee, J., Kim, B., and Ahn, S. (2019). Maintenance optimization for repairable deteriorating systems under imperfect preventive maintenance. Mathematics7(8), 716.
  • Kim, B., Jeong, Y. S., Tong, S. H., and Jeong, M. K. (2019). A generalised uncertain decision tree for defect classification of multiple wafer maps. International Journal of Production Research, 1-17.

  • Choi, J., Kim, B., Jeong, Y., Han, H., Yoo, J., and Jeong, M. K. (2017). Data mining-based variable assessment methodology for evaluating the contribution of characteristics of knowledge services of a public research institute to business performance of firms. Expert Systems with Applications, 84, 37–48.

  • Kim, B., Gazzola, G., Lee, J. M., Kim, Coh, B. Y., and Jeong, M. K. (2017). Two phase edge outlier detection model for technology opportunity discovery. Scientometrics, 113(1), 1-16.
  • Kim, B., Jeong, Y. S., Tong, S. H., Chang, I. K., and Jeong, M. K. (2016). Step-down spatial randomness test for detecting abnormalities in DRAM wafers with multiple spatial maps. IEEE Transactions on Semiconductor Manufacturing, 29(1), 57-65.
  • Rodriguez, A., Tosyali, A., Kim, B., Choi, J., Lee, J. M., Coh, B. Y., and Jeong, M. K. (2016). Patent clustering and outlier ranking methodologies for attributed patent citation networks for technology opportunity discovery. IEEE Transactions on Engineering Management, 63(4), 426-437.
  • Kim, B., Jeong, Y. S., Tong, S. H., Chang, I. K., and Jeong, M. K. (2015). A regularized singular value decomposition-based approach for failure pattern classification on fail bitmap in a DRAM Wafer. IEEE Transactions on Semiconductor Manufacturing, 28(1), 41-49.
  • Jeong, Y. S., Kim, B., Tong, S. H., Chang, I. K., and Jeong, M. K. (2015). Quantifying the risk level of functional chips in DRAM wafers. IEEE Intelligent Systems, (6), 21-24.
  • Rodriguez, A., Kim, B., Lee, J. M., Coh, B. Y., and Jeong, M. K. (2015). New multi-stage similarity measure for calculation of pairwise patent similarity in a patent citation network. Scientometrics, 103(2), 565-581.
  • Rodriguez, A., Kim, B., Lee, J. M., Coh, B. Y., and Jeong, M. K. (2015). Graph kernel based measure for evaluating the influence of patents in a patent citation network. Expert Systems with Applications, 42, 1479–1486.
  • Yoo, S. H., Kim, B., and Jeong, M. K. (2015). Modelling of technology lifetime based on patent citation data and segmentation. Journal of the Operational Research Society, 66, 450-462.
  • Kim, B., Gazzola, G., Lee, J. M., Kim, D., Kim, K., and Jeong, M. K. (2014). Inter-cluster connectivity analysis for technology opportunity discovery. Scientometrics, 98(3), 1811-1825.
* Corresponding Author

Domestic Journal

  •  Sung, T.-E., Lee, J., Kim, B., Jun, S.-P., Pakr, H.-W. (2017). The study on the elaboration of technology valuation model and the adequacy of volatility based on real options. Journal of Korea Technology Innovation Society, 20(3), 732-753.